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Keck Center for Advanced Microscopy and Microanalysis

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  • Home
  • About Keck CAMM
    • Staff
    • Faculty
  • Downloads
  • FAQ
  • Gallery
  • Instruments & Fees
    • Fees & Rates
    • Talos F200C
    • Auriga 60 CrossBeam
    • JEM-2010F
    • JEM-3010
    • JSM-7400F
    • Tecnai G2 12
    • Dimension-3100 V SPM
    • MultiMode NanoScope V SPM
  • Publications
  • Scheduling
  • Training

Scheduling

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Our Major Instruments

Auriga 60 CrossBeam (FIB/FE-SEM)
JSM-7400F (FE-SEM)

Talos F200C (200kV FE-TEM)
JEM-2010F (200kV FE-TEM)
JEM-3010 (300kV TEM)
Tecnai G2 12 (120kV TEM)

Dimension-3100 V SPM
MultiMode NanoScope V SPM

Contact Us

W. M. Keck Center for Advanced Microscopy & Microanalysis

456 Harker Interdisciplinary Science and Engineering Laboratory
University of Delaware
Newark, Delaware 19716

(302) 831-6795

http://www.camm.udel.edu/
  • Home
  • About Keck CAMM
    • Staff
    • Faculty
  • Downloads
  • FAQ
  • Gallery
  • Instruments & Fees
    • Fees & Rates
    • Talos F200C
    • Auriga 60 CrossBeam
    • JEM-2010F
    • JEM-3010
    • JSM-7400F
    • Tecnai G2 12
    • Dimension-3100 V SPM
    • MultiMode NanoScope V SPM
  • Publications
  • Scheduling
  • Training
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