Keck Center for Advanced Microscopy and Microanalysis

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About Keck CAMM
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Gallery

: Talos F200C

: JEM-2010F

: JSM-7400F

: JEM-3010

: TecnaiG2-12

: Auriga-60

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Our Major Instruments

Auriga 60 CrossBeam (FIB/FE-SEM)
JSM-7400F (FE-SEM)

Talos F200C (200kV FE-TEM)
JEM-2010F (200kV FE-TEM)
JEM-3010 (300kV TEM)
Tecnai G2 12 (120kV TEM)

Dimension-3100 V SPM
MultiMode NanoScope V SPM

Contact Us

W. M. Keck Center for Advanced Microscopy & Microanalysis

456 Harker Interdisciplinary Science and Engineering Laboratory
University of Delaware
Newark, Delaware 19716

(302) 831-6795

http://www.camm.udel.edu/

Home
About Keck CAMM
- Staff
- Faculty
Downloads
FAQ
Gallery
Instruments & Fees
Publications
Scheduling
Training

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