The W. M. Keck Center for Advanced Microscopy and Microanalysis (Keck CAMM) has been established since 2001 through generous grants from the W. M. Keck Foundation, NSF, and funds from the University of Delaware. This facility contributes to scientific capabilities by enabling students, faculty, and other researchers in the University, in addition to those from regional institutions and facilities, to use the state-of-the-art equipment for research and education.
The Keck Center is currently located in the Harker Interdisciplinary Science and Engineering (ISE) Laboratory on the UD campus. It houses two 200 kV field emission transmission electron microscopes JEM-2010F and Talos F200C, a LaB6 300kV TEM JEM-3011, an FEI 120kV Tecnai G2 12 Twin TEM, two scanning electron microscopes (JSM-7400F and AURIGATM 60 CrossBeamTM, with the AURIGATM 60 being a FIB-SEM dual beam instrument), and two scanning probe microscopes (Multimode NanoScope V and Dimension 3100 V).
Read more >>