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Keck Center for Advanced Microscopy and Microanalysis

  • Home
  • About Keck CAMM
    • Staff
  • Downloads
  • FAQ
  • Gallery
  • Instruments & Fees
    • Fees & Rates
    • Talos F200C
    • Auriga 60 CrossBeam
    • JEM-2010F
    • JEM-3010
    • JSM-7400F
    • Tecnai G2 12
    • Dimension-3100 V SPM
    • MultiMode NanoScope V SPM
  • Publications
  • Scheduling
  • Training

Author: Yu

About Keck CAMM

Posted on October 14, 2015January 15, 2016 by Yu
  The W.M. Keck Center for Advanced Microscopy and Microanalysis has been established since 2001 through generous grants from the W.M. Keck Foundation, NSF, and funds from the University of Delaw... Read More

Our Major Instruments

Auriga 60 CrossBeam (FIB/FE-SEM)
JSM-7400F (FE-SEM)

Talos F200C (200kV FE-TEM)
JEM-2010F (200kV FE-TEM)
JEM-3010 (300kV TEM)
Tecnai G2 12 (120kV TEM)

Dimension-3100 V SPM
MultiMode NanoScope V SPM

Contact Us

W. M. Keck Center for Advanced Microscopy & Microanalysis

456 Harker Interdisciplinary Science and Engineering Laboratory
University of Delaware
Newark, Delaware 19716

(302) 831-6795

http://www.camm.udel.edu/
© 2025 Keck Center for Advanced Microscopy and Microanalysis. All Rights Reserved. Coller Theme by Rohit.
  • Home
  • About Keck CAMM
    • Staff
  • Downloads
  • FAQ
  • Gallery
  • Instruments & Fees
    • Fees & Rates
    • Talos F200C
    • Auriga 60 CrossBeam
    • JEM-2010F
    • JEM-3010
    • JSM-7400F
    • Tecnai G2 12
    • Dimension-3100 V SPM
    • MultiMode NanoScope V SPM
  • Publications
  • Scheduling
  • Training
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