JSM-7400F

7400pic

1 kV: 1.5 nm
15 kV: 1.0 nm
Accelerating voltage: 0.1kV-30kV
SEI, BSE
Gentle Beam Method
R-filter
Ultra-thin window XEDS
Web-SEM
JSM-7400F high resolution scanning electron microscope
Applications: XEDS, high resolution imaging with SEI, BSE, r-filter, and gentle beam imaging modes to provide compositional and/or topographical information
Accelerating Voltage: 100V to 30kV
Filament: Cold field emitter
Resolution: 1 nm at 15 kV or 1.5 nm at 1 kV
XEDS System: Ultra-thin window Si-Li X-ray detector (active area = 30 mm2) capable of detecting elements with Z > 4
Oxford detector with Oxford acquisition software
Location: ISE Laboratory – Room 172