JEM-3010 Transmission Electron Microscope Applications: BF/DF/SAED Analytical STEM XEDS In-situ TEM Accelerating Voltage: Optimized at 300k eV, aligned at other lower voltages Filament: LaB6 Resolution: 0.17 nm point 0.1 nm line XEDS System: EDAX Image Acquisition: AMT 1k x 1K Sample Holders: Single & double tilt Poseidon electrochemical Aduro 300 heating/electric Location: ISE Laboratory – Room 159